HA6000FThe light source strobe measuring instrument is used to record rapidly changing photometric waveforms, spectraPstShort term flicker index and flicker effect visualization parametersSVM、Flicker perceptionMpWaiting for flicker related parameters. Light scintillation index for dedicated light sources and lighting sites（FLICKER）Measurement, or measurement of flash frequency and photometric change curves of transient light sources such as flashlights, car xenon lamps, warning lights, etc. It can also be used for measuring photometric parameters of stable light sources. Can be used in conjunction with integrating spheres, light intensity devices, and brightness tubes

▲Adopting high-speed technologyCPUProcessor high-precision electronic optical sensor, high-speed16bitADSampling provides more stable performance and higher accuracy.

▲The upgrade of the system adopts an embedded operating system with more open source code, which is more in line with the application design of intelligent products and provides a solution for subsequent instrument upgrades Space limited, user-friendly interface system;

▲adopt10.1HDIPSCapacitive touch screen, high display resolution, displaying more content on one screen, vivid colors, more realistic graphic display, smoother touch and use, more reasonable interface design, and stronger user experience;

▲ Millisecond quick power on/off, one click testing, more convenient to use.

▲ Convenient system updates and upgrades

Measurement parameter standards

▲ Basic measurement

▲IEEE PAR 1789《IEEE Std 1789TM-2015

How to translate▲IEC-PstShort term scintillation indexNEMA 77-2017Defined short-term flicker index（

Pst）▲

CA CEC(California Energy Efficiency)▲ASSISTTheASSISTstipulated

MpThe calculation method

▲CIE SVMFlashing percentagePFThe-Scintillation indexFIThe-Periodic frequency of light outputfThe-Short term flicker indexPstThe-Visualization parameters of flicker effectSVMThe-ASSIST

Flicker perception

1MpPerformance and technical indicatorsRange of illuminance measurement:0.1 lx～4 200,000 lx

2; Automatic and4Range measurement;

3Measurement accuracy: Level 1 (±)％）；Sampling rate:1kS/s, 5kS/s, 10kS/s 100 kS/sSetting); （

4kS/s: Thousand samples per second)Sampling time:

50.1s-200s(1kS/s)

6Can be set;

7Rated working conditions:Measurement methods: illuminance, brightness, luminous flux, light intensitySave file format:PDFTheGDF

The

1EXCLE

Main testing parameters

2Basic measurementFrequency, maximum value, minimum value, average value, flicker index, flicker percentage, modulation depth, flicker depth, photometric image, photometric image enlargement, spectrogram

The

3IEEE1789Frequency, maximum value, minimum value, average value, flicker index, flicker percentage, modulation depth, flicker depth, modulation depth hazard assessment map

The

IEC PstFrequency, maximum value, minimum value, average value, flicker index, flicker percentage, modulation depth, flicker depth, photometric image, photometric image enlargement, spectrogramPstThe

4Pstevaluate

TheCA CECFrequency, maximum valuePAMThePAM（40Hz）ThePAM（90Hz）ThePAM（200Hz）ThePAM（400Hz）ThePAM（

51000Hz）Luminescence chart, magnification of photometric chart, spectrum chart

TheCA CECFlicker index, flicker percentageMPTheDPThedTheaThefbThe

6MPEvaluation, photometric chart, photometric chart enlargement, spectrogram

TheCIE SVMFrequency, maximum value, minimum value, average value, flicker index, flicker percentageSVMThe