The development of Shanghai rapid temperature change test chamber is unstoppable Shanghai Rapid Temperature Change Test ChamberIt can be used to test the durability of material structures or composite materials under continuous high and low temperature environments in an instant. It is suitable for adaptability testing of various materials such as electrical, electronic products, semiconductors, electronic circuit boards, metal materials, bearings, etc. in rapidly changing temperature environments in scientific research, schools, factories, and other units.
withShanghai Rapid Temperature Change Test ChamberIn terms of performance, compared to a professional simulation of various electronic components in rapidly changing environments of high and low temperatures, testing their various performance indicators. Below, we will introduce to you the standards for their experiments?
The requirements for low-temperature areas shall comply with the provisions of Chapter 3 of GJB150.4-86 "Equipment Environmental Test Method - Low Temperature Test". The requirements for high temperature zones shall comply with the provisions of Chapter 3 of GJB150.3-86 "Equipment Environmental Test Methods - High Temperature Test".
Shanghai Rapid Temperature Change Test ChamberThe volume should ensure that the temperature of the test chamber (room) can reach the tolerance range of the test conditions specified in Article 3.2 of GJB150.1-89 when the test sample is placed in the reserve for more than 10% of the test temperature holding time.
Shanghai Rapid Temperature Change Test ChamberSuitable for judging the reliability and stability performance of aerospace products, information electronic instruments, materials, electrical and electronic products, and various electronic components in high and low temperature or humid and hot environments. We will provide you with a basis for predicting and improving the quality and reliability of our products. So, how much do you know about the refrigeration system of the experimental equipment? The Shanghai rapid temperature change test chamber is divided into three parts: high temperature zone, low temperature zone, and testing zone. It adopts an original Japanese made microcomputer large LCD display control system in both Chinese and English. Equipped with a fully automatic, high-precision system, any component action is locked and processed by P.L.C; When there is a mechanical failure, it is equipped with automatic circuits and warning signals. If the input voltage is found to be unstable, it has an emergency stop device. The Shanghai rapid temperature change test chamber has an independent heating, cooling, and humidification system, which can reduce testing costs, increase lifespan, and reduce failure rates. The refrigeration unit adopts the original French "Taikang" fully enclosed compressor unit. The refrigeration system adopts a unit or binary low-temperature circuit system design. The multi wing air supply fan in the United States provides strong air circulation, avoiding any dead corners and ensuring even temperature and humidity distribution in the testing area.