High speed sampling processing

The resistance value changes caused by ion migration phenomenon are as follows:

The situation of high-speed sampling processing:

Slow sampling processing:

There is a significant deviation in the detection results between high-speed and ordinary processing:

Simultaneous sampling and processing of all channels:

The situation where ion migration occurs simultaneously in multiple channels is as follows:

If a single AD scan is used, it is inversely proportional to the number of channels, and the more channels there are, the less accurate it is.

Each channel is equipped with AD, which can monitor all channels simultaneously.

The analog circuit of J-RAS can prevent dendrite burnout

The equipment is equipped with a current limiting circuit, which ensures that even if the dendrite is short circuited, it will not input power beyond the range to the sample.

High speed 16msec sampling processing can detect low resistance values in a timely manner and stop the bias output power of the analog circuit in a timely manner. (Set according to the judgment criteria)

High speed, multi-channel simultaneous sampling, J-RAS is capable of parallel processing of large amounts of data.

In short, the high-speed, multi-channel parallel processing of J-RAS equipment can more reliably detect migration phenomena.