Power semiconductor devices are a type of power electronic device used for energy conversion and control. They play a role in rectification, inversion, voltage rise/fall, and frequency conversion in circuits, and are widely used in industries such as new energy generation, electric vehicles, rail transit, and industrial automation. Due to the fact that devices generally operate in various harsh environments such as industrial grade and automotive grade, live reliability testing is required. Among them, power cycling testing is one of the key testing items to assess the reliability of power device packaging.

Customer background

Customer Z is a domestic supplier of electronic component reliability testing equipment and overall solution service provider, dedicated to the research and development, production, and service of electronic component reliability testing equipment. It holds a leading position in the industry in reliability testing of power semiconductor devices, IGBT modules, as well as integrated circuit reliability testing equipment such as SoC, MCU, and Memory.

Pain points of customer early testing

With the rapid development of power semiconductor devices such as SiC and IGBT, the demand for reliability testing is increasing rapidly. Customer Z mainly needs to conduct power cycle aging testing on power semiconductor devices, facing the following three major testing pain points:

The number of power cycle tests is generally as high as tens of thousands of times, such as at least 60000 second level power cycles and at least 15000 minute level power cycles. Each cycle means that the heating power supply needs to be turned on and off once. If the dynamic response of the power supply is not timely or there are large fluctuations or even overshoot in the current during operation, it will have adverse effects on the control of heating energy and the safe operation of power devices;

Ripple

Excessive ripple may cause internal components of the device to overheat, shorten the working life of the device, and seriously affect long-term power cycling testing;

L Volume

A general power cycle testing system requires at least 3 high current power supplies. If the volume of the testing power supply is too large, customers have higher requirements for reserved testing space.

Our solution

In response to the above customer needs, we provide the N36200 series ultra stable low ripple programmable power supply, which has been tested in real scenarios for a long time and has effectively met the initial requirements.

Stable and reliable

By optimizing device selection, system heat dissipation, and loop control, the 24-hour output drift (30min thermal engine) can be ensured to be ≤ 0.01%, and the 1000h output drift can be ≤ 0.05%. The output is stable after long-term operation and supports CC priority mode, ensuring zero overshoot of high current output;

Low ripple

The effective value of current ripple Irms is ≤ 0.1%, and the output current is purer and interference free;

L Province Space

The 2U space supports outputting a high current of 1100 A, saving user testing space.

In addition, our company can provide source meters, full voltage level DC power supplies, and other products to meet the live reliability testing needs of power semiconductor devices such as HTRB and HTGB.