1 micron mobile probe holder probe adjustment holder

The main material is made of stainless steel, with a finely polished surface, good rigidity, and corrosion resistance

The displacement part adopts imported cross roller guide rails with ultra-high precision

The overall drive adopts precision micrometer head, quantitative reading, and precise control

◆ Overall linear displacement, ultra-high stability

◆ Matching multifunctional adjustment probe fixture, with knob adjustment and fixation, greatly facilitates customer adjustment of probes

The bottom has a super strong adjustable magnetic base, which can adjust the presence or absence of magnetic force through a knob. The magnetic adsorption capacity is 5kg, ensuring the stability of the entire system

◆ Can be combined with high-frequency probes to form RF series high-frequency probe holders

Product application:
◆ Especially suitable for sample electrodes at the micrometer level

◆ Suitable for R/F measurement, I/O point measurement, DC/DC testing, wafer testing, resistance voltage testing, solar cell testing, photocurrent testing, semiconductor device analysis testing, etc

Technical parameters:

Probe displacement stroke: XYZ three-dimensional rotation of approximately 13mm+180 °+60 ° up and down tilt

Overall structural dimensions: 290mm × 110mm × 120mm (LWH)

◆ Probe overall displacement accuracy: 1 μ m

Leakage accuracy: coaxial cable (10pA)

Imported triple coaxial cable（100fA）

◆ Optional connectors: For coaxial cables, BNC, crocodile clip, and banana plug can be selected

Imported tri coaxial cables can only choose tri coaxial interfaces(Triaxial)

Measurement range: Current: 10pA/100fA-10A

Voltage: Maximum1000V