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Xi'an Cewei Optoelectronic Technology Co., Ltd
Custom manufacturer

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Xi'an Cewei Optoelectronic Technology Co., Ltd

  • E-mail

    xiancewei@163.com

  • Phone

    13891853675,15091835132,15291572455

  • Address

    18th Floor, Block A, Haijing International, No. 22 Fengcheng 2nd Road, Economic Development Zone, Xi'an City, Shaanxi Province (upstairs of SEG Computer City)

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6JA interference microscope features:

NegotiableUpdate on 12/06
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Overview
6JA interference microscope features: The interference microscope 6JA is an instrument used to measure the smoothness of precision machined parts (flat, cylindrical, etc. outer surfaces), and can also be used to measure the depth of surface grooves, coatings, etc
Product Details

6JAinterference microscope

Microscope features:
interference microscope6JA is an instrument used to measure the smoothness of precision machined parts (such as flat surfaces, cylindrical surfaces, etc.), and can also be used to measure the depth of surface markings, coatings, etc.

Technical parameters:

Measure the range of surface smoothness

10-14

Numerical aperture of working objective lens

0.65

work distance

0.5mm

Field of view of the instrument

Visual inspection:φ0.25mm

photograph:0.21* 0.15mm

Magnification factor of micrometer eyepiece

Visual inspection:500X

photograph:168X

Magnification factor of micrometer eyepiece

12.5X

Dividing value of micrometer drum

0.01mm

Green interference filter wavelength

λ≈5300Å

half width

Δλ≈100Å

Workbench lift

5mm

XYDirectional movement range

≈10mm

Rotating motion range

360˚

Instrument standard mirror high reflectivity

≈60%

Low reflectivity

≈4%

Adjustable transformer input voltage

220V

Output voltage

4V-6V

Instrument dimensions

270*160*230mm

Instrument weight

5kilogram

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