Automatic X-ray powder diffractometer

Automatic X-ray powder diffractometer

X-ray diffractometer is a widely used X-ray diffraction analysis instrument. Mainly used for phase analysis of solid substances, crystal structure analysis, texture analysis of materials, determination of grain size, crystallinity, stress, etc.

The XD-2 X-ray diffractometer is a domestically produced new type of diffractometer with independent intellectual property rights launched by Beijing Puxi General Instrument Co., Ltd. Zuixin, ending the situation of no significant improvement in domestic diffractometer products in the past decade.

The Science and Technology Achievement Appraisal Center of the Ministry of Education organized an appraisal of this achievement on December 27, 2002. The appraisal committee was composed of 9 experts and professors, including Mr. Liang Jingkui, an academician of the Chinese Academy of Sciences. Experts from the appraisal committee highly praised the successful development of this product. The main appraisal conclusion of the appraisal meeting is as follows: "The key technical indicators of XD2 have reached the level of similar foreign equipment, with stable performance and reliable operation. In addition, multiple specialized software have been developed to significantly improve work efficiency compared to imported equipment equipped with general software. Experts from the appraisal committee believe that this product can completely replace imported products in conventional powder X-ray analysis work, and suggest promoting its application in China. The appraisal committee unanimously agreed to pass the appraisal.

Technical Specifications:

1. Goniometer scanning radius: 180mm, scanning method: θ/2 θ or θ/θ, scanning axis: horizontal

2. Angle repeatability of angle measuring instrument: 0.0006 degrees

3. X-ray generator kV, mA stability: better than 0.01%

4. Rated power of X-ray generator: 3kW

Automatic X-ray powder diffractometer Key Features:

1. New structure: The angle measuring instrument of XD-2 diffractometer adopts a vertical structure, hollow axis, integrated X-ray tube seat and angle measuring instrument structure, which is a new type of advanced domestic diffractometer;

2. The diffraction angle measurement accuracy is high, and the angle measurement reproducibility reaches 0.0006 degrees;

3. Long term operation stability is good. After long-term (8 months) monitoring by users, the standard deviation of quartz 101 diffraction angle measurement is 0.0015 degrees;

4. Chinese graphical interface diffraction instrument control software, diffraction data processing software, and some diffraction analysis application software, various specialized X-ray analysis software developed to meet the professional needs of domestic users;

5. We can provide various accessories and supporting equipment commonly found in diffraction instruments, such as graphite bent crystal monochromators; The innovative product parallel light path thin film attachment from Blagg Technology has a diffraction intensity 2-3 times higher than existing attachments for the same purpose; Equipped with a high reliability, low-noise cycle with dual compressors specifically designed for laboratory users.

Product advantages

Adopting a vertical angle measuring instrument structure, user-friendly sample replacement method, more stable sample placement and testing position, intuitive use, easy cleaning of the sample table, and greatly simplified operation and maintenance;

The control method adopts subdivision drive power technology, which has high accuracy and good reproducibility;

• Low angle scanning function, with regular scanning angles starting from 0.5 °;

Long term stability is good, and after long-term (8 months) use by users, the standard deviation of quartz 101 diffraction peak test is 0.0015 °;

The gate adopts a rotary shutter, which has faster opening and closing speed, lower failure rate, and better radiation blocking performance;

The radiation dose outside the cabinet is less than 0.2 μ Sv/h (the national standard requires it to be less than 2.5 μ Sv/h);

Chinese window operation interface, new PDP diffraction data processing software package, diverse data output.