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Dongguan Ke'ao Precision Instrument Co., Ltd
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Dongguan Ke'ao Precision Instrument Co., Ltd

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    keaoyiqi@163.com

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    No. 124, BuBuGao Avenue, Wusha Management Zone, Chang'an, Dongguan City, Guangdong Province

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Introduction to Model Classification

NegotiableUpdate on 12/05
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Overview
Introduction to MM/HM sub model classification: MM/HM series measuring microscopes have multiple sub models for users to choose from according to their suffixes, such as A, B, BT, U, F, H, M. They can also be combined, such as AH, FH, FHM, etc., representing different configurations
Product Details

MM/HMIntroduction to sub model classification

MM/HMThe series of measuring microscopes have multiple sub models for users to choose from according to their suffixes, such asABBTUFHMThey can also be combined asAHFHFHMWait, they represent different configurations.

Some commonly used sub model configuration instructions:

AType:
Equipped with a specialized three eye observation tube for measurement, which has a built-in cross shaped marking line and is matchedTMSeries long working distance objective lens.

BType:
Equipped with built-inLEDThe universal illumination device is built with a metallographic microscope module as the optical head, which can not only measure dimensions, but also perform metallographic observations in various modes such as bright field, simple polarization, and differential interference.

BTType:
Equipped with built-inLEDUniversal lighting fixture, matchingTMSeries long working distance objective lens.

FType:

The lighting fixture provided isFAType, with auxiliary focusing function, can achieve more accurate resultsZDirection measurement. The optical head is constructed using a metallographic microscope module, which can not only measure dimensions, but also perform metallographic observations in various modes such as bright field, dark field, simple polarization, and differential interference.

UType:
The optical head is constructed using a metallographic microscope module, which can not only measure dimensions, but also perform metallographic observations in various modes such as bright field, dark field, simple polarization, and differential interference.

HType:
Z
The axis is equipped with a grating ruler, compatibleMM/HMAll models can be usedZDirection measurement.

MType:
Z
axle
Can be electrically lifted and lowered, compatibleMM/HMAll models can be usedZDirection measurement.

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