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Shanghai Spectral Analysis Instrument Co., Ltd
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Shanghai Spectral Analysis Instrument Co., Ltd

  • E-mail

    2356253838@qq.com

  • Phone

    18918225919

  • Address

    No.16 Zhongxin Road, Jiufu Development Zone, Songjiang District, Shanghai

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Platform based flat plate spectrometer

NegotiableUpdate on 12/31
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Overview
The TU-1810T platform based flat plate spectrometer has an advanced operating system, over 20 years of development and manufacturing experience, and * product technical indicators, achieving a new generation of flat plate flat plate spectrometer without any fixtures Touch screen one click image display
Product Details
TU-1810T Platform Flat Plate Spectral Tester

Advanced operating system, over 20 years of development and manufacturing experience, * product technical indicators, have achieved a new generation of platform based flat plate spectrometer without any fixtures Touch screen one click image display. Mainly suitable for testing solid and glass samples: measuring the optical properties of solid, thin film, lens, beer bottle, tablet, mobile phone camera, architectural glass, touch screen industry, textile, jewelry appraisal, vacuum coating, single-layer and multi-layer window glass components with a minimum specification of φ 1.5mm-500 * 500mm Power on self calibration; Touch screen+PC dual-mode operation terminal; Software version UV10.0

Ultra spacious sample platform
Can wine bottles be tested? The answer is yes!

PDF output

Dual mode operation+PC end (spectral analyst software)
optical system 1600/diffraction grating, enhanced proportional monitoring
Narrow slit bandwidth 0.5/1.0/1.8/3.8
wavelength range 190—1100 nm, Wavelength resolution of 0.1 nm
The data shows Intelligent touch screen 8-inch, Bluetooth, wireless network, PDF, USB flash drive EXCEL
wavelength accuracy ± 0.1nm (@ 656.1nmD2, ± 0.3nm (full wavelength range)) repeatability ≤ 0.15nm
stray light ≤0.02%T(220nm Nal;360nm NaNO2)
Luminous range 0-200%T,-0.301-4.0A,-9999-9999C
Photometric accuracy ±0.002A(0-0.5A),±0.3%T(0-99%T)
Photometric repeatability ±0.001A(0-0.5A),±0.15%T(0-99%T)
baseline flatness ± 0.0015A; baseline drift ± 0.0015A/h
Photometric noise ± 0.001A (500nm, 0A, 2nm spectral bandwidth)
Wavelength edge noise Transmittance of 0% noise: ≤ 0.2%; Transmittance of 99% Noise: ≤ 0.3%
Instrument volume and weight 560 * 370 * 330mm; Weight 15kg
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