Polycrystalline X-ray diffractometer

Polycrystalline X-ray diffractometer

XD6 typePolycrystalline X-ray diffractometerUsed for qualitative and quantitative analysis of crystal material structure. This product is designed on the basis of XD3, and the scanning radius of the angle measuring instrument is continuously adjustable. This function allows users to balance between the instrument's angle measurement resolution and the intensity of the test diffraction line, set the required test conditions themselves, and meet the testing needs of different situations. XD6 has increased the speed of rapid rotation, thereby improving experimental efficiency.

Polycrystalline X-ray diffractometerFeatures:

·New structure, adopting a vertical angle measuring instrument structure, more convenient sample placement method, simplified operation and maintenance workload, more intuitive use, and easy cleaning of the sample stage after the experiment.

·Adopting segmented driving power technology, the scanning radius is continuously adjustable.

·Imported NaI scintillation crystal counting detector with good resolution and long-term stability.

·The X-ray tube sleeve is made of integral copper rod with better positioning accuracy and radiation protection; Adopting a rotary shutter, the switch speed is faster, the failure rate is lower, the radiation blocking performance is better, and the radiation dose outside the cabinet is lower.

·The digital control circuit of the X-ray light source has been further improved, and the working power of the X-ray machine is set remotely by the computer. The loading process of high pressure and pipe flow is automatically controlled by a microcomputer, making it easier to use and more reliable to operate.

·Chinese window operation interface, newly redesigned PDP diffraction data processing software package, supporting multiple data output methods.