Semiconductor inspection microscope

P series microscope - equipped with a perfect optical system and new generation optical technology, and built-in multiple observation methods such as bright field, dark field, polarization, differential interference (DIC), etc.Polarization can be used to display the texture and crystal morphology of materials,It is very suitable for detecting chips andLCDstructure；Differential Interference Contrast(DIC)Used to assist in observing subtle detailsSamples with height differencesThis technology is very suitable for detecting samples with small height differences, such as magnetic heads, hard disk media, and polished chips; The dark field isThe ideal tool for detecting subtle scratches or defects on specimens, as well as mirror samples such as chips.

PA53MET

The microscope system has multiple functions and adopts an ergonomic and easy-to-use design, which can provide maximum 300mmWafer, flat panel display, printed circuit boardAnd high-quality observations of other large samples. This product adopts a flexible module design, which can provide the best observation system suitable for various inspection purposes.

Panthera TEC

open up or clear out by poking or jabbingcrossgiveHuaxian OpticsEOC Combining image analysis software,Make it easier for operators to obtain the required images and inspect the product;Not only can the sample be observed microscopicallyCan also perform precise data measurements such as two-dimensional and three-dimensional measurements，The overall inspection process, from observation to report generation, has become simple and smooth.Widely applicableIn industries such as semiconductors, textiles, materials science, healthcare, new energy, electronics, etc.

HXJ-MX6R