TDH series three terminal device dedicated probe station FET testing TFT testing

NegotiableUpdate on 01/20

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

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Overview

Product Introduction: In practical scientific research, due to the increasing size of samples/wafers, the probe stations used for testing are quite expensive. Our company has independently developed this TDH series probe station based on customer market applications, which has a compact structure, practical functions, and low cost. On the basis of meeting basic testing functions, non essential components are removed. The probe station system includes: optical imaging part, optical base, probe holder, four-dimensional adjustment system, and vacuum adsorption system;

Product Details

Product information:
In practical scientific research, due to the increasing size of samples/wafers, the probe stations used for testing are quite expensive. Our company has independently developed this TDH series probe station based on customer market applications, which has a compact structure, practical functions, and low cost. On the basis of meeting basic testing functions, non essential components are removed. The probe station system includes: optical imaging part, optical base, probe holder, four-dimensional adjustment system, and vacuum adsorption system;

TDHThe series probe station includes three independent precision probe holders, which can be used in conjunction with digital source meters to complete testing of three terminal devices. It can test materials such as diodes, transistors, field-effect transistors, wafer level devices, etc., and can complete testing of their I/V, c/V, resistance, capacitance, and other parameters.

Product features:

★ Compact structure, practical functions, lightweight quality, easy to move

★ Can be used for testing samples up to 12 inches in size

★ Compatible with high magnification electron microscopes, capable of 360 ° rotation and fine adjustment of lifting and lowering

★ Leakage current accuracy: 10pA/50fa (shielded box)

★ Precision screw/dovetail transmission structure, linear movement, precise displacement, no return difference design

★ Applied to higher education institutions/research institutes/company laboratories

★ Electrode/PAD usage above 1 micron

★ Modular design, which can add and remove corresponding modules according to the application

Product application:

◆ LD/LED/PD intensity/wavelength testing (integrated with our company's optoelectronic instruments)

Analysis and testing of IV/CV and other characteristics of materials/devices

◆ Wafer analysis and testing

Technical parameter selection:

Specifications/Parameters
model		TDH-4	TDH-6		TDH-8		TDH-12
Dimensions (LWH)		450×300×355mm	600×450×355mm		600×500×355mm		600×600×355mm
Power demand		220VC,50-60HZ
sample stage	size	4 inches	6 inches		8 inches		12 inches
	trip	Overall XYZR four-dimensional displacement, XY stroke 100mm, Z-axis stroke 13mm, R-axis 360 ° rotation lockable
	Mobile accuracy	3μm
	Back electrode testing function	Can lead out electrodes	Can lead out electrodes		Can lead out electrodes		Can lead out electrodes
	Custom Module	Customizable displacement stroke and accuracy
Probe adjustment seat	XYZ itinerary	13mm-13mm-13mm
	Mechanical accuracy	Standard configuration: 3 μ m (upgradable/1 μ m)
	Leakage accuracy	100fA (equipped with shielding box)
	Installation method	Adjustable magnetic adsorption/vacuum adsorption
	interface type	Triax axis
optical imaging	magnification	7-200 times (maximum upgradable up to 720 times)
	CCD pixels	2000W
	center distance	140mm， Lifting range 270mm, total height 350mm
	monitor	12 inch monitor, capable of magnifying 3-17mm samples to the entire screen (upgradable large-sized microscope)
Optional Accessories		Heating chuck		High and low temperature chuck		Gold plated chuck
		Vibration isolation bracket		Integral Ball Test Options		shielding box
		RF Test Accessories		Import light source bracket		Wavelength monochrome adjustable fiber optic light source (metering current)
		Microscope adjustment manual/electric adjustment device		Laser cutting microscope		Adapter accessories
Chuangpu Instrument can build probe stations according to customer applications to achieve better resultsofUsage effectiveness and cost-effectiveness