Ultra fast high and low temperature airflow impact testing machine

NegotiableUpdate on 12/22

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

The ultra fast high and low temperature airflow impact testing machine is suitable for various types of flash memory Flash/EMMC, PCB circuit board IC, optical communication (such as transceiver transceiver high and low temperature testing, SFP optical module high and low temperature testing, etc.), semiconductor chips, electronics industry, etc. for IC characteristic analysis, temperature impact testing, high and low temperature cycle testing failure analysis and other reliability tests.

Product Details

Ultra fast high and low temperature airflow impact testing machineTechnical Specifications:

Dimensions: W (width) 660mm * H (height) 1120mm * D (depth) 1040mm

Temperature range: -80 ℃ to+250 ℃

Control accuracy: ± 0.5 ℃

Impact airflow rate: 4-18SCFM (1.8-8.5L/s)

Impact rate: -55 degrees +125 degrees, recovery time≤10S

Ultra fast high and low temperature airflow impact testing machinecontrol system

1.15 inch large human-machine interface

2.Supports USB and LAN, enabling remote control of computers and mobile phones

3.Two detection modes: AIR NOTE and DUT MODE

4.operation mode

1) Manual operation: manual switching/Automatic loop.

2) Program: Manual Switching/Automatic loop.

Ultra fast high and low temperature airflow impact testing machineWorking Principle:

1. The output airflow hood of the testing machine covers the tested object, forming a relatively enclosed testing chamber. The high or low temperature airflow output by the testing machine causes a drastic change in the surface temperature of the tested object, thereby completing the corresponding high and low temperature impact test;

2. It can isolate a single IC or other component among many components and perform high and low temperature impact separately without affecting other surrounding devices. Compared with traditional cold and hot impact test chambers, the temperature change impact rate is faster

Ultra fast high and low temperature airflow impact testing machineMeet the test standards:

1. GB/T 2423.1-2008 Test A: Low temperature test method;

2. GB/T 2423.2-2008 Test B: High temperature test method;

3. GB/T2423.22-2012 Test N: Temperature Change Test Method

4. GJB/150.3-2009 High Temperature Test

5. GJB/150.4-2009 Low Temperature Test

6. GJB/150.5-2009 Temperature Shock Test

Ultra fast high and low temperature airflow impact testing machineWorking mode:

A) 2-channel main air duct output, divided into 8-channel gas supply by distribution head, with 2 sets of 1-to-8 systems

B) Two detection modes: Air Mode and DUT Mode

Test and cycle at high/room temperature/low temperature (or not at room temperature)

Ultra fast high and low temperature airflow impact testing machineCan target a single component among numerous componentsIC or other componentsIsolate it separately for high and low temperature impact without affecting other surrounding devicesCompared with traditional cold and hot shock test chambers, the impact rate of temperature changes is faster.

It is to spray the compressor air with controlled temperature from the nozzle, and it only takes a few seconds to reach the necessary environment for temperature testing. Compared with ordinary high and low temperature impact test chambers, it greatly shortens the testing time and improves production efficiency.