WZH series high-temperature probe station

NegotiableUpdate on 01/20

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Nature of the Manufacturer: Producers

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Overview

Product Introduction: The WZH series high-temperature probe station system includes: optical imaging part, integral lifting base, high-precision probe holder, temperature control system, vacuum adsorption system, etc; It can be applied to the electrical performance testing and analysis of tested samples in high-temperature environments, such as semiconductor/microelectronics, electronics, mechatronics, physics, chemistry, materials, optoelectronics, nanotechnology, microelectromechanical/MEMS, biochips, aerospace and other scientific research fields, as well as IC design/manufacturing/testing/packaging, LED, LCD/OLED, LD/PD, PCB, FPC and other production and manufacturing fields. It is a powerful high-performance probe station.

Product Details

Product information:
Probe stations are mainly used for testing in the semiconductor industry, optoelectronic industry, integrated circuits, and packaging. The research and development of precision electrical measurements widely used in complex and high-speed devices aims to ensure quality and reliability, and reduce research and development time and device manufacturing process costs.

The cost-effective manual probe station developed by Chuangpu Instrument is widely used in integrated circuits, transistors, diodes, and photodetectorsIV/CVParameter and other performance testing and characterization are essential basic equipment in optoelectronic research.

WZHThe series high-temperature probe station system includes: optical imaging part, integral lifting base, high-precision probe holder, temperature control system, vacuum adsorption system, etc; Can be applied to the electrical performance testing and analysis of tested samples in high-temperature environments, such as semiconductors/Microelectronics, electronics, electromechanics, physics, chemistry, materials, optoelectronics, nanotechnology, microelectromechanical engineering/MEMSIn the fields of scientific research such as biochips and aerospace, as well asICdesign/manufacture/test/PackagingLED、LCD/OLED、LD/PD、PCB、FPCWaiting in the field of production and manufacturing. It is a powerful high-performance probe station.

Product features:
★ Testeable Wafer Size: 2 inches to 4 inches (can also be upgraded to larger sizes)

★ The overall displacement of the probe holder and sample is very convenient for customers to perform synchronous photoelectric testing on the sample

★ Leakage current accuracy:100fA, up to a maximum of10fA

★ Precision lead screw/Swallowtail transmission structure, linear movement, precise displacement, no return difference design

★ Applied to higher education institutions/institute/Used in the company laboratory

★1Electrode size above micrometers/PADuse

★ Modular design, which can add and remove corresponding modules according to the application

★ Adopting imported temperature control system, excellent temperature stability and temperature control uniformity

Product application:
◆LD/LED/PDThe intensity of light/Wavelength testing (integrated with our company's optoelectronic instruments)

◆ Materials/The device'sIV/CVCharacteristic analysis and testing

◆ Wafer analysis and testing

Technical parameter selection:

Specifications/Parameters
model		WZH-4
Dimensions (LWH)		600mm×600mm×450mm
Power demand		220VC,50-60HZ
sample stage	size	4-inch (round/square) can be customized with larger sample tables
	trip	XY axis stroke 50mm; Z-axis stroke 60mm (rotation function can be added)
	Mobile accuracy	XY axis overall 1 μ m; Z-axis 10 μ m
	Back electrode testing function	Can lead out electrodes
	by suction	Paired with imported oil-free vacuum pump, 7L/min
	Custom Module	Customizable displacement stroke and accuracy
temperature control	Temperature range	Room temperature -300 ℃ (room temperature -27K)
	precision	±0.1℃
	Temperature control stability	±1℃
	Uniformity of temperature control	±3℃
Probe adjustment seat	XYZ itinerary	13mm-13mm-13mm
	Mechanical accuracy	1μm
	Leakage accuracy	100fA/10fA
	Installation method	Adjustable magnetic adsorption/vacuum adsorption
	interface type	Triax axis
optical imaging	magnification	7-200 times (maximum upgradable up to 720 times)
	CCD pixels	2000W
	center distance	140mm， Lifting range 270mm, total height 350mm
	monitor	12 inch monitor, capable of magnifying 3-17mm samples to the entire screen (upgradable large-sized microscope)
Optional Accessories		Gold plated chuck	Integral Ball Test Options	shielding box
		Vibration isolation bracket	Import light source bracket	Wavelength monochrome adjustable fiber optic light source (metering current)
		Microscope adjustment manual/electric adjustment device	Laser cutting microscope	Adapter accessories
Chuangpu Instrument can build probe stations according to customer applications to achieve better resultsofUsage effectiveness and cost-effectiveness