Carbon film surface inspection microscope XS-14C

NegotiableUpdate on 03/04

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

Product Overview: The XS-14C carbon film surface inspection microscope consists of a high color rendering reflective light source and a high-definition eyepiece objective lens

Product Details

product overview

The XS-14C carbon film surface inspection microscope consists of a high color rendering reflective light source and a high-definition eyepiece objective lens. Mainly used for surface inspection of carbon films in transmission electron microscopy (TEM) consumables. Optional cameras and computers can measure and save microscopic images of carbon film surfaces for technicians to analyze product quality. Microscope magnification 50X-500X

Product features:

1. The microscope adopts a long-distance high-definition objective lens, with a large working distance to avoid contaminating the sample.

2. Using a high color rendering reflective light source for easy microscopic identification of surface traces on the sample.

Specification parameters

Serial Number	Product name and model	Product parameters
1	Reflection microscopeXS-14C	Magnification factor:50-500X
2	Hd cameraPZ-M3GSeries (optional)	310ten thousand-2000Ten thousand pixels, recommended for use600megapixel
3	Brand computer (optional)	operating systemWin7/10Memory4Gor above
4	Ultra clean workbench (optional)