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Shanghai Dumei Precision Instrument Co., Ltd
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Shanghai Dumei Precision Instrument Co., Ltd

  • E-mail

    dmsci@vip.163.com

  • Phone

    021-56654814

  • Address

    707-709A, Science and Technology Building, Shanghai University Science and Technology Park, 788 Guangzhong Road, Jing'an District, Shanghai

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Dual beam electron microscope

NegotiableUpdate on 03/17
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Overview
Dual Beam Microscope Scios Dual Beam ThermoScientific Scios Dual Beam is a high-resolution Dual Beam analysis system that can analyze numerous samples, including magnetic materials, with excellent 2D and 3D performance
Product Details

DualBeammicroscope

Scios DualBeam

Thermo Scientific ™ Scios ™ DualBeam ™It is a high-resolution productDualBeamThe analysis system can perform excellently2Dand3DPerformance analysis includes numerous samples, including magnetic materials.Scios DualBeamThe innovative features of can improve throughput, accuracy, and usability, making it highly suitable for advanced research and analysis in academic, government, and industrial research environments.

Advanced detection technology isThermo Scientific ™ Scios DualBeamThe core technology. Inside the lensFEI Trinity ™Detection technology can collect all signals simultaneously, saving time and creating sharp contrast, which helps to collect as much data as possible. The innovative concentric backscatter detector under the lens can improve efficiency, allowing you to select signals based on their angular distribution, making it easy to separate material and morphology contrast, even if the landing energy is20 eVThe same goes for it.

Scios DualBeamThe Application of Materials Science

Scios DualBeamEspecially suitable for many materials such as metals, composites, and coatings, it can:

  • Perform high-resolution and high contrast imaging, including magnetic samples

  • useTrinityThe detection kit synchronously detects materials, shapes, and edge contrast to analyze various properties of materials

  • By using drift suppression lithography, position specific slices can be made without preparing samples, and even non-conductive materials can be manipulated

  • Generate a three-dimensional data cube to determine the size and distribution of inclusions in metal, or analyze the stress and strain in various directions at the crack tip

  • matchEasyLift ™High quality samples can be prepared quickly and reliably, and only the minimum electron beam energy is required to obtain high-quality samplesS/TEMresult

  • be directed againstDealBeam Common applications provide unique user guides and step-by-step workflows, making it easy for any experienced operator to get started immediately

  • https://www.fei.com/uploadedImages/FEISite/Pages/Products/DualBeam/Scios/Models/Scios2_ApplicationImage.jpg?n=9114