EXPLORER multifunctional X-ray diffractometer

1. Application scope:

EXPLORER can perform conventional crystal phase identification and quantification, and can analyze the calculation of crystal size, lattice strain, and crystallinity. It can also quantitatively analyze residual austenite, polycrystalline screening, crystal structure analysis, residual stress analysis, thin film analysis, depth analysis, phase transformation texture and preferential orientation, and nanoparticle analysis.

2. Overview

EXPLORER adopts a modular design, and all components can be split into 7 modules, while samples can be tested in 5 independent degrees of freedom. At the same time, EXPLORER can provide multiple configurations, such as a wider range of X-ray sources, optical paths, sample stages, and detectors, to meet various application needs. In addition, the direct transmission torque motor is combined with the advantageous optical encoder to ensure the transmission speed and accuracy of the instrument, which can be competent for qualitative and quantitative analysis of various samples.

3. Technical specifications

3.1 X-ray Generator

3.11 Maximum output power: 3 KW (optional 4 kW)

3.12 Output stability:<0.01% (10% voltage fluctuation)

3.13 Maximum output voltage: 60kv

3.14 Maximum output current: 60A (optional 80A)

3.16 Voltage step width: 0.1kV

3.17 Current step width: 0.1mA