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E-mail
13714836101@163.com
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Phone
13714836101
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Address
Building B, No. 3 Third Road, Yangyong Industrial Zone, Songgang Street, Bao'an District, Shenzhen
Shenzhen Ruitaier Technology Co., Ltd
13714836101@163.com
13714836101
Building B, No. 3 Third Road, Yangyong Industrial Zone, Songgang Street, Bao'an District, Shenzhen
Application of Electronic Cigarette Heating Wire Life Testing Machine
The Shenzhen Ruitaier Technology Electronic Cigarette Heating Wire Life Testing Machine is mainly used to test the number of smoking ports, smoke temperature, vibration frequency, and display status of test lights. The principle is to adjust a certain amount of suction or suction pressure, and the nozzle sucks and stops the sample repeatedly until the electronic cigarette or electronic cigarette battery is exhausted or drops to a certain voltage. The number of times obtained is used to determine the service life of the electronic cigarette or electronic cigarette battery and make improvements accordingly.

Research and Manufacturing Principle of Electronic Cigarette Heating Wire Life Testing Machine
In electronic cigarettes, the heating wire is responsible for heating and evaporating the e-liquid, producing mist, also known as resistance wire, which is actually a metal wire or alloy wire. The resistance of the heating wire changes with temperature, and the current temperature control technology for electronic cigarettes is based on this characteristic of metal to achieve temperature control function. For example, the resistance of a heating wire at room temperature is 0.1 Ω. After being powered on, if the temperature rises to 100 ℃, the resistance changes to 0.13 Ω, then to 0.15 Ω at 200 ℃, and to 0.19 Ω at 300 ℃. Based on this resistance change pattern, the chip will calculate the temperature of the heating coil. And this resistance change law is the "TCR" temperature resistance change coefficient,The "TCR" value of each material is different, so if different materials of coils are used, there must be TCR data corresponding to the material inside the host chip in order to obtain the temperature corresponding to the change in coil resistance through coefficient conversion based on the initial resistance.

