HA6000F strobe tester

The HA6000F flicker tester is used to record rapidly changing photometric waveforms, spectra, Pst short-term flicker index, flicker effect visualization parameters SVM, flicker perception Mp, and other flicker related parameters in real time

HA6000F strobe testerIt is used for real-time recording of rapidly changing photometric waveforms, spectra, Pst short-term flicker index, flicker effect visualization parameters SVM, flicker perception Mp, and other flicker related parameters. Measurement of FLICKER (flicker index) for specialized light sources and lighting sites, or measurement of flash frequency and photometric change curves for transient light sources such as flashlights, car xenon lamps, warning lights, etc. It can also be used for measuring photometric parameters of stable light sources. Can be used in conjunction with integrating spheres, light intensity devices, and brightness tubes

▲ Adopting a high-speed CPU processor and high-precision electronic optical sensor, with high-speed 16 bit AD sampling, the performance is more stable and the accuracy is higher.

The upgrade of the system adopts an embedded operating system with more open source code, which is more in line with the application design of intelligent products and provides unlimited space for subsequent instrument upgrades, with a user-friendly interface system;

▲ Adopting a 10.1 high-definition IPS capacitive touch screen, with high display resolution, displaying more content on one screen, vivid colors, more realistic graphic display, smoother touch and use, more reasonable interface design, and stronger user experience;

Quick power on/off in milliseconds, one click testing, more convenient to use.

▲ Convenient system updates and upgrades

Measurement parameter standards

▲ Basic measurement

▲ IEEE PAR 1789《IEEE Std 1789TM-2015》

The IEC Pst short-term flicker index and NEMA 77-2017 specify the short-term flicker index (Pst)

▲ CA CEC (California Energy Efficiency)

ASSIST specifies the calculation method for Mp

▲ CIE SVM

Flicker percentage PF, flicker index FI, periodic frequency of light output f, short-term flicker index Pst, flicker effect visualization parameter SVM, SSIST flicker perception Mp

Performance and technical indicators

1. Illumination measurement range: 0.1 lx to 200000 lx; Automatic and 4-speed range measurement;

2. Measurement accuracy: Level 1 (± 4%);

3. Sampling rate: 1kS/s, 5kS/s, 10kS/s, set at 100 kS/s); (kS/s: thousands of samples per second)

4. Sampling time: adjustable from 0.1s to 200s (1kS/s);

5. Rated working conditions:

6. Measurement methods: illuminance, brightness, luminous flux, light intensity

7. Save file formats: PDF, GDF, EXCEL

HA6000F strobe testerMain testing parameters

1. Basic measurement

Frequency, value, minimum value, average value, flicker index, flicker percentage, modulation depth, flicker depth, photometric image, photometric image enlargement, spectrogram

2、IEEE1789

Frequency, value, minimum value, average value, flicker index, flicker percentage, modulation depth, flicker depth, modulation depth hazard assessment diagram

3、IEC Pst

Frequency, value, minimum value, average value, flicker index, flicker percentage, modulation depth, flicker depth, photometric image, photometric image enlargement, spectrogram

Pst, Pst evaluation

4、CA CEC

Frequency, value PAM、PAM（40Hz）、PAM（90Hz）、PAM（200Hz）、PAM（400Hz）、PAM（1000Hz） Luminescence chart, magnification of photometric chart, spectrum chart

5、CA CEC

Flicker index, flicker percentage, MP, DP, d, a, fb, MP evaluation, photometric image, photometric image enlargement, spectrogram

6、CIE SVM

Frequency, value, minimum value, average value, flicker index, flicker percentage, SVM, SVM evaluation, photometric plot, photometric plot enlargement, spectrogram