High resolution thermal field emission scanning electron microscope

NegotiableUpdate on 03/17

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Nature of the Manufacturer: Producers

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Overview

The high-performance SEMApreo composite lens design with rich functions of scanning electron microscope Apreo combines electrostatic and magnetic immersion technology, which can generate high resolution and signal selection

Product Details

scanning electron microscope

Apreo

Feature rich high-performance SEM

The Apreo composite lens design combines electrostatic and magnetic immersion techniques to produce high resolution and signal selectivity. This makes Apreo a research platform for studying nanoparticles, catalysts, powders, and nanodevices without compromising the performance of magnetic samples.

Apreo benefits from in lens backscatter detection, which provides excellent material contrast even when tilted, at short working distances, or used for sensitive samples. The new composite lens further improves contrast and increases charge filtering for imaging insulating samples through energy filtering. The optional low vacuum mode now has a maximum sample chamber pressure of 500 Pa, which can image demanding insulators.

Through these advantages, including composite final lenses, advanced detection, and flexible sample processing, Apreo can provide outstanding performance and versatility to help you tackle future research challenges.

Apreo Materials Science Applications

The new Apreo scanning electron microscope (SEM) can detect various materials such as nanoparticles, metals, composite materials, and coatings, and integrates innovative features to provide better resolution, contrast, and usability.

The unique composite final lens can provide excellent resolution (1.0 nm at 1 kV voltage) on any sample, even when tilted or conducting terrain measurements, without the need for electron beam deceleration.
Backscatter detection - always ensuring good material contrast, even when imaging electron beam sensitive samples at TV rate with low voltage and electron beam current at any tilt angle.
Detector - can combine the information provided by various detector parts to obtain crucial contrast or signal strength.

Experience the advantages brought by Apreo SEM

Composite final lensExcellent resolution (1.0 nm at 1 kV voltage) can be provided on any sample, even when tilted or conducting terrain measurements, without the need for electron beam deceleration.
Backscatter detection-Always ensure good material contrast, even when imaging electron beam sensitive samples at TV rate with low voltage and electron beam current at any tilt angle.
detector-The information provided by each detector section can be combined to obtain crucial contrast or signal strength.
Multiple charge mitigation strategiesIncluding a low vacuum mode with a maximum sample chamber pressure of 500 Pa, imaging of any sample can be achieved.
Analysis platform:Provide high electron beam current and small spot size. The sample chamber supports three EDS detectors, coplanar EDS and EBSD, and a low vacuum system optimized for analysis
Sample processing and navigation are very simpleIt has a multi-purpose sample holder and Nav Cam+.