Hitachi desktop microscope TM4000/TM4000 Plus

Product details:

Desktop scanning electron microscope(SEM)Newly upgraded.

We use“Higher image quality, easier to use, and easier to observe”Developed for the conceptTM4000Series. On this basis, we have launched more diverse functionsTM4000ⅡSeries.
We provide you with a brand new application for observation and analysis.

Product features:

Observe the image3minute. Quickly obtain the required data and produce reports.

||Flexibility in observation and analysis

Automatically obtain various types of data. Quickly switch!

Can quickly obtain element distribution maps*2

*1 TM4000PlusⅡThe function.

*2Optional

||useCamera Navi*In that case, it's as simple as that

Camera NaviImages make it easy for you to find your field of view and distribution map(MAP)The entire function supports your observation throughout the process

* Optional:Camera Navisystem

||Easy and fast operation

Observing images only requires 3 minute.
Can quickly observe images and export test reports.

||Report CreatorCan make it easy for you to create reports

Simply select the image and template to createMicrosoft Word、Excel、PowerPointFormat report

||Even insulation samples can be observed directly without pre-treatment.

“Static electricity reduction mode”Can suppress static electricity phenomenon

For samples that are prone to static electricity, they can be used“Static electricity reduction mode”Observe while suppressing static electricity.

Simply click on the software with the mouse to switch to“Static electricity reduction mode”.

||Multiple observations can be made under low vacuum conditions

For powders or samples containing water that are prone to static electricity, observation can be conducted based on their purpose.

||Secondary electron imaging (surface shape) observation can be performed under low vacuum conditions.

No pre-treatment is required, and the surface of insulation materials and samples containing water or oil can be observed

Not only can traditional conductive samples be observed, but also insulating materials and samples containing water or oil can be observed without pre-treatment. It can quickly switch between secondary electron images and backscattered electron images.

||High sensitivity low vacuum secondary electron detector

Adopting high sensitivity and low vacuum secondary electronic detector(UVD)By detecting the light generated by the collision between electron beams and residual gas molecules, images with secondary electron information can be observed. In addition, by controlling the detector to detect the light generated by electron irradiation, it is possible to obtainCLInformation（UVD-CL: WithCLThe image of information.

||Can support acceleration voltage20 kV

TM4000Ⅱ/TM4000Plus IICan support acceleration voltage20 kV.

rely onEDSAnalysis (optional) can perform higher count rate analysis.

||By accelerating the voltage20 kV, achieveEDSThe height of the element distribution mapS/Nchange

||Multi Zigzag(Optional)

Can be implemented in a wide areaSEMObserve.

Paired with an automatic motor table, it can achieve low magnification, high precision, and large-scale observation and analysis.

||EMSample stand (optional)

||Easy to observe STEMimage

Compared to the newly developedSTEMSample stage and high sensitivity low vacuum secondary electron detector(UVD)When used together, it can easily observe small magnificationSTEMImage.

Easy observation of thin film samples and biological samples

||Product specifications: