Integrated roughness profile measuring instrument

NegotiableUpdate on 10/15

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

Brief introduction: One measurement is used to achieve roughness, waviness, and contour analysis. The roughness contour integrated measuring instrument realizes the measurement of roughness and waviness in the entire range. The X direction adopts a new type of digital sensor with higher accuracy. Z1 adopts independently developed high-precision multi-stage inductive sensor with ultra large range, which maximally maintains the original accuracy of the sensor. Adopting high rigidity, high-precision, maintenance free linear motion guide rail and precision control system.

Product Details

Details introduction:

Dense and stable data sources provide powerful support for later data processing and computation.

Product Overview Product Parameters VR Display

Specification Number	parameter
measurement range	X-axis	0-200mm optional
	Z-axis	0-620mm optional
	Z1 axis	6mm,2mm
Linear accuracy	contour	≤± 0.07% f.s. (95mm measuring rod)
Linear accuracy	roughness	≤±(12nm+3%)

Contour measurement: Line features, point features, distance between points, distance between lines, and positional accuracy of various types of workpiece surfaces, including distance, parallelism, perpendicularity, angle, groove depth, groove width, and radius, can be analyzed for straightness and convexity.

Contour analysis: Pa, Pt, Pp, Pv, Pz, Pq, PS, Psk, Pku, Pmr

粗糙度测量： Ra、Rp、Rv、Rz、Rz（jis）、R3z、RzDIN、Rzj、Rmax、Rc、Rt、Rq、Rsk、Rku、Rsm、Rs、R △ q、Rk、Rpk、Rvk、Mr1、Mr2、Rmr

Waviness parameters: Wa, Wt, Wp, Wv, Wz, Wq, Ws m, Ws k, Wku, Wmr