-
E-mail
sales@sgm7.com
- Phone
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Address
No. 10 San Yue Road, Pujiang Town, Shanghai
Shanghai Huatong Optical Instrument Co., Ltd
sales@sgm7.com
No. 10 San Yue Road, Pujiang Town, Shanghai
| Research oriented upright industrial microscopeJXM-3020 ▲Mainly used for identifying and analyzing the internal structure and organization of metals, applied in factories or laboratories for casting quality identification, raw material inspection, or research and analysis of metallographic structure after material processing. ▲industryMicroscope provides users with digital photography expertiseCCDHigh definitionDVMultiple image acquisition modes are available, and professional metallographic analysis software modules can be provided according to user needs,It can also edit, save, and print the required images. ▲Widely applicable performance, capable of performing bright field, dark field, and polarized observation. ▲The objective lens, eyepiece, and observation tube have all undergone effective anti mold treatment, ensuring continuous clear images and extending the lifespan of the microscope | |
| JXM-3020研究型Industrial Microscopeconfiguration table | |
| component | Technical Specifications |
| magnification | Optical amplification: 100-800X; System amplification: 100-2800X |
| fuselage | Reflective illumination microscope body: integrally die cast; |
| Infinite chromatic aberration independent correction optical system;Introducing German Zeiss optical path design for superior imaging | |
| Coaxial coarse and fine adjustment handwheel, adjustable handwheel height. The body includes a power supply(100V~240V) | |
| Observation tube | Binocular observation tube group: distance between pupils of both eyes52-75mm;30°Tilt; The refractive power is adjustable.(Spectral ratio)0:100) |
| eyepiece | WF10X/20,High Eyepoint,The refractive power is adjustable. |
| Metallographic objective lens | Plan 10X/0.25 WD20.0 |
| Plan 20X/0.40 WD9.3 | |
| Plan 50X/0.70 WD2.4 (Spring) | |
| Plan 80X/0.8 WD1.7 (Spring) | |
| Falling shotPolarized lightingdevice | Lighting device:Used for bright field and polarized observation during falling light illumination. Built in type4colorScreenmirror |
| 12V50WHalogen lightbox;12V100Wpower supply;12V50Whalogen lamp | |
| Polarizing mirror | |
| Analyzer mirror | |
| Carrier platform | Mechanical mobile stage:platform dimensions156x138mm,X/YAxis movement range76x54mmLow coaxial positionX/YMove the adjustment handwheel. |
| converter | Internal tilting four hole converter |
| interface | 1XZeiss interface(0.5XOptional) |
| Lighting bulb | 12V50W Osramhalogen bulb |
| System Composition | Computer type(JXM-3020C)1、metallographic microscope 2、videographyAdaptive mirror3、300Ten thousand pixel camera(matchHToup-Viewsoftware) 4ComputerOptional |
| Digital type(JXM-3020D): 1、metallographic microscope 2Digital adaptive glasses3Digital camera | |
. Scientific grade lossless format image output and storage
. High fidelity color reproduction using natural color matrix technology
. Global white balance and regional white balance functions
. Design of anti electromagnetic interference structure
. Convenient and fast one click device software installation, one click image acquisition and storage function
. Rich selection of photography interface accessories, suitable for the vast majoritymicroscope,Biological Microscope,polarizing microscopeMetallographic microscope,Phase contrast microscope, etc
| serial number | pixel | resolution | photography | category | layout | interface | connection method |
| 01 | 300ten thousand | 2048 X 1536 | 3.2MP | Color CMOS | 1/2” | C-Mount | USB2.0 |
| 02 | 520ten thousand | 2592 X 1944 | 5.2MP | Color CMOS | 1/2” | C-Mount | USB2.0 |
| 03 | 800ten thousand | 3264 X 2448 | 8.0MP | Color CMOS | 1/2” | C-Mount | USB2.0 |
| 04 | 910ten thousand | 3488 X 2616 | 9.1MP | Color CMOS | 1/2” | C-Mount | USB2.0 |
| 05 | 1000ten thousand | 3664 X 2748 | 10MP | Color CMOS | 1/2” | C-Mount | USB2.0 |
| 06 | 1400ten thousand | 4384 X 3288 | 14MP | Color CMOS | 1/2” | C-Mount | USB2.0 |
| The above cameras are all equipped with measurement, processing, segmentation, fusion and other functional software, with clear effects and easy use | |||||||
HToup View software Introduction to Image Processing Software
| Image acquisition: | The resolution size, capture and storage format, image attributes, color, brightness, contrast, exposure, white balance and other parameters of the image can be set, and can be used for photography, video recording, timed photography, etc. |
| Image measurement: | The image can be measured for parameters such as perimeter, perimeter, angle, area, circle diameter, and ellipse length and diameter, for example, using tools such as short lines, rectangles, irregular shapes, ellipses (circles), three-point circles, etc., and the parameters can be exported in EXCEL formatIt can synchronously display the image size ratio (i.e. scale bar), making the image size positioning more accurate |
| Image processing: | Real time dynamic adjustment of brightness, chromaticity, saturation, and red-green-The blue color can be adjusted to perform image processing such as color inversion, relief, sharpening, smoothing, graying, noise removal, rotation, flipping, and mirroring on the captured image. |
| Annotated drawing: | Convenient and efficient text annotation, arrow indication, and various geometric shape annotations. |
| Image segmentation: | Monochrome and multi-color binary threshold adjustment, corrosion and pore removal functions further accurately delineate contours, and segment images |
| Image stitching: | When the microscope can only capture partial images of the specimen, arrange the obtained partial images in order, and then use the image stitching function to obtain the global image of the entire specimen for research and storage. |
| Image Fusion: | When the thickness of the specimen is uneven or there is a height difference on the surface, due to the limitation of the depth of field of the high-power objective lens, only clear local images can be observed. Therefore, images from different focal planes can be captured, and the image fusion function can be used to obtain a complete and clear image. |
| quantity statistics | Quickly count the quantity and provide parameters such as overall and individual perimeter and area, which can be used for overall or local statistics, and the measured data can be exported. |
| Graphic and textual report: | Help you easily create experimental reports that combine text and images, provide detailed textual explanations for specimen images, and print them. |
Each set of cameras includes:
| digital camera (Standard)CInterface1.8riceUSBCable) | 1 |
| TCN-0.5Photography receiver,23,30,30.5Millimeter direct insertion interface (optional) | 1 |
| 0.01Millimeter micrometer (optional) | 1 |
| Driver and software CD | 1 |
| Certificate of Conformity | 1 |
| carton packaging | 1 |
| Product advantages: |
| Sony Japan(SONY)CompanyExView HADseriesCCDimage sensor |
| The image processing circuitUltra-FineTMColor engine rendering technology |
| sensor chipPCBACenter pre calibration process (error ±)2Pixel) |
| comply withISO9001TheISO14001TheRoHSTheCETheFCCWaiting for quality and environmental certification standards |
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| Product Features: |
| Extremely high sensitivity |
| Extremely high quantum efficiency |
| Extremely high signal-to-noise ratio |
| Extremely low dark current |
| Extremely low readout noise |
| Ultra long controllable exposure time |
| Advanced white balance settings |
| ROIVariable area |
| 1X1The2X2The4X4Pixel overlay enhancement(BINNING) |
| Fully enclosed high-quality aluminum alloy metal shell |
| Support platform drivers and applications:Microsoft WindowsTheMacTheLinux |
| Support multiple videosAPIinterfaceDirectShowTheTwainTheLabView |
| Data output interface:USB2.0TheUSB3.0 |
| Optical interface:C-MountTheCS-MountTheF-Mount |
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| Application fields: |
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| Bright field, phase contrast, and dark field microscopes |
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| Pathology, histology, and cytology |
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| Immunofluorescence microscope |
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| Green fluorescent protein(GFP)The application |
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| fluorescence in situ hybridization |
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| Calcium ion ratio analysis |
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| Vitality and Movement Analysis |
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| Deoxyribonucleic acid analysis |
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| metallographic microscope |
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| semiconductor inspection |
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| Manufacturing Quality Control |
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| Failure Analysis |
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| Forensic analysis |
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| Hematoxylin-Eosin staining observation (pathology) |
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| Gel imaging |
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| semiconductor inspection |
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| Solar panel inspection |
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