Silicon carbide single crystal microscope PZ-THG

NegotiableUpdate on 03/04

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Overview

Product Overview: Silicon Carbide Single Crystal Research Microscope PZ-THG. The commonly used microscopes are polarizing microscope and stereomicroscope

Product Details

product overview

Silicon carbide single crystal research microscopeThe commonly used PZ-THG microscopes are polarizing microscopes and stereomicroscopes. Polarized microscope can be used for microscopic analysis of defects in silicon carbide single crystals. The stereomicroscope can observe SiC single crystals grown by sublimation method, and the number of microtubes observed before and after sample corrosion can also be used to microscopically observe macroscopic defects in SiC single crystals.

Specification parameters

Serial Number	product name/Model number	Technical Parameter
1	stereomicroscope/XT-13C	Magnification factor:8.0X-80X is used to observe the number of microtubules andmacrodefect
2	polarization microscope/XP-63C	Magnification factor:40X-600XUsed for silicon carbide single crystalmicrotubuleMicroscopic analysis of defects
3	High definition digital camera/PZ-800M3G	8 million pixels with two-dimensional measurement function
Optional instruments
1	Automatic precision cutting machine	Cutting speed0.1-5mm/s precise adjustable, cutting accuracy can reach 0.01mm
2	Automatic precision grinding and polishing machine	Grinding and polishingFlatness of circular discs with a diagonal length of ≤ 142mm or rectangular planes with a diagonal length of ≤ 142mm: less than 0.002mm per 20mm x 20mm
3	Cutting and polishing auxiliary materials