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Beijing Funo Technology Development Co., Ltd

  • E-mail

    sales@grantlab.com.cn

  • Phone

    18510859188

  • Address

    1011, Building A, East Asia Wangjing Center, Guangshun South Street, Chaoyang District, Beijing

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Split Pea Ultra Micro ATR

NegotiableUpdate on 10/18
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Overview

ATR and specular reflection provide versatility for applications. Due to minimal or no sample preparation, the sample throughput is high. Usually maintain the integrity of the sample. Small sampling area - the diameter of silicon crystal ATR is less than 250 µ m, and the diameter of diamond is less than 500 µ m.

Product Details

Split Pea Ultra TraceATR

HarrickofSplitPea™ It's a levelATRAccessories, with a sampling area of allATRSmall component in accessories - siliconATRThe diameter of the crystal is less than250µm, DiamondATRThe diameter is less than500µm.SplitPea™ Configure to apply local measurement pressure to the sample andATRGood contact is established between crystals. This makes it very suitable for fast and simple spectral measurements of various samples. These include: hard samples such as paint fragments and composite chemical substrates; Small samples, such as individual fibers and nanoliters of liquid; For example, transparent films and their defects. Apart from makingATRNano sampling is simple and clear,SplitPea™ also hasPermaPurge™ Function, can quickly exchange samples and crystals without interrupting spectrometer cleaning.HarrickSplitPeaHATR

The accessories are substitutes for infrared microscopes, beam spotlights, and diamond batteries.

featureATR

The mirror reflection function provides versatility for applications.

Due to minimal or no sample preparation, the sample throughput is high.

Usually maintain the integrity of the sample.Small sampling area-Silicon crystalATRThe diameter is less than250µmThe diameter of diamond is less than500µm

.

Due to the small sampling area, it can greatly reduce stray light.inertiaATR

Crystals can be used for near-infrared to far-infrared.Calibrated pressure applicator for repeatable useATR

Measurement.Designed forATR

The optimal contact between crystals and hard surface solids.

Flip type streamlined pressure applicator for easy access to the sampling area.DTGS

High energy throughput of the detector.HarrickuniquePermaPurge™ Allow for quick exchange of samples andATR

Crystals without interrupting the purification of Fourier transform infrared systems.

Anti overflow cover.200The options include flowing through a liquid pool and a heatable sampling plate, which can be used for°C