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Beijing Puxi General Instrument Co., Ltd
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Beijing Puxi General Instrument Co., Ltd

  • E-mail

    yafei.wei@pgeneral.com.cn

  • Phone

    13681197768

  • Address

    No. 3 Pingsan Road, Pinggu District, Beijing

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XRF6 Energy Dispersive X-ray Fluorescence Spectrometer

NegotiableUpdate on 09/19
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Overview

The XRF6 energy dispersive X-ray fluorescence spectrometer accurately determines the content of gold, silver, platinum, palladium, copper, zinc, nickel, iridium and other elements in gold, platinum and silver jewelry, and provides test results that meet the requirements of the national standard GB/T18043 according to the definition;

Product Details

XRF6 Energy Dispersive X-ray Fluorescence SpectrometerAccurately determine the content of elements such as gold, silver, platinum, palladium, copper, zinc, nickel, iridium, etc. in gold, platinum, and silver jewelry, and provide test results that meet the requirements of the national standard GB/T18043 according to the definition;

quantitative analysis
A. FP basic parameter method
B, Standard method
C, 1 point correction

Features:

·Adopting imported high-resolution detectors

·Accurate: High analysis accuracy, reassuring detection results.

·Quick: No special requirements for samples, can be directly tested, usually within 60-100 seconds to determine the content of gold, silver, platinum, palladium, copper, zinc, nickel, and iridium in the jewelry.

·Simple: The comprehensive automated testing function enables true one click operation without any form of training, and can be used immediately.

·Non destructive: Non destructive non-destructive testing of jewelry.

·Economy: Directly test accessories without the need for consumables, saving costs.

·Safety: The light gate system interacts with the X-ray interlocking safety device to ensure personnel safety.

·Standard: The test results fully comply with the accuracy requirements of the national standard GB/T 18043-2013.

XRF6 Energy Dispersive X-ray Fluorescence SpectrometerSpecification
Analysis principle: Energy dispersive X-ray fluorescence analysis method
Analyze the elements Si~U (Cd/Pb/Cr/Hg/Br high-precision type)
Na~U (optional: switching mode type with a diameter of 1.2mm/0.1mm)
Detection limit Cd/Pb/Hg/Br/Cr ≤ 5ppm
The sample shape is 460 × 380mm in size (150mm in height)
Sample plastic/metal/paper/coating/ink/liquid
The atmosphere in the sample room is atmospheric
X-ray tube target Rh
Tube voltage up to 50KV
Tube current is 1mA high
X-ray irradiation diameter 1/3/5mm
Protection<0.1mR/Hr (radiation lower than computer screen)
Silicon SIPIN detector
Optical image observation magnification of 15 times
Software qualitative analysis: automatic qualitative analysis (automatic background removal/automatic peeling of overlapping peaks/automatic compensation of escape peaks/automatic compensation of spectral drift)
Illumination diameter: 1/3/5mm
Quantitative analysis: Basic parameter method/Standard method/Point calibration
Computer CPU Pentium IV 1.8GHz or above
Memory above 256MB
Hard drive of 20GB or more
OS WindowXP
Monitor 17 inch LCD
The ambient temperature is between 10 and 35 degrees Celsius. C (performance temperature)/5-40. C (operating temperature)
The surrounding humidity is 5-31. Temperature range at C: below 80% relative humidity
31-40. Temperature range at C: relative humidity below 50%
Power supply AC110V/220V ± 10%, 50/60HZ
Power consumption below 1.3KVA (including computer, LCD, printer)
The equipment weighs approximately 65kg (excluding tables and computers)
Dimensions: 600 (W) × 545 (D) × 435 (H) mm

after-sales service

  • Free on-site installation: Yes
  • Warranty period: 1 year
  • Can the warranty period be extended: Yes
  • Warranty maintenance commitment: free repair and replacement of parts
  • Repair commitment: Response within 24 hours
  • Free instrument maintenance: regular follow-up visits
  • Free training: 1 person of model comes to Beijing for free training
  • On site technical consultation: Yes