Cross dispersion full spectrum direct reading ICP emission spectrometer

NegotiableUpdate on 03/08

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

Is the place of origin in the United States imported for processing and customization? No, item number 3566651, model BOEN-3566651

Product Details

Inductively Coupled Plasma Atomic Emission Spectrometer:

Efficient and unparalleled performance

Unparalleled cost-effectiveness; Can be used for daily and moderate flux sample analysis in the laboratory.
The system features easy-to-use ICP Expert II software, making it an ideal choice for educational research institutions and laboratories that need to comply with WEEE/RoHS directives.

characteristic:

Plasma performance - enables direct analysis of organic samples and reduces sample preparation time
Excellent optical system - continuous wavelength coverage, multiple element and spectral line options, extended dynamic range, reduced interference, making analysis results more reliable
High sensitivity - dedicated sample introduction system and axial observation plasma provide high sensitivity for trace analysis applications
Durable and sturdy - radial observation plasma and efficient sample introduction system; Can achieve analysis of harsh matrix samples
Can enhance performance - the application of a large number of optional accessories can improve the performance of the instrument in specific application areas
Intuitive - Powerful - Easy to Use ICP Expert II Software
Cost saving cold cone interface technology - no need to use expensive cutting gases

Software:

Intuitive, powerful, and easy to use
The software is easy to use and allows operators to quickly get started with its patented Fast Automatic Curve Fitting technology (FACT) and MultiCal function monitoring, ensuring higher accuracy of results even for samples with complex matrices.

characteristic:

Easy to use - worksheet style software includes guides and comprehensive multimedia tools to guide you through every step of the operation
Simplified method development - Fitted background correction technology ensures fast analysis
High precision - The patented fast automatic curve fitting technology (FACT) solves the problem of spectral interference and ensures higher accuracy in detecting complex matrices
High confidence in results - MultiCal function can monitor and judge the measurement results of two or more wavelengths for each element, broaden the linear range, and provide more accurate results in a single measurement