GX60 differential interference phase contrast metallographic microscope

The upright differential interference phase contrast metallographic microscope is suitable for reflective differential interference phase contrast observation of the surface morphology of opaque objects, and can also be used for perspective microscopy observation of transparent objects. By adopting an excellent infinite optical system and modular functional design concept, the system can be easily upgraded to achieve polarization observation, differential interference phase contrast observation, and other functions. The compact and stable high rigidity body fully reflects the anti vibration requirements of microscopic operations. Ideal design that meets ergonomic requirements, making operation more convenient, comfortable, and spacious. Suitable for microscopic observation of metallographic structure and surface morphology, it is an ideal instrument for research in metallurgy, mineralogy, and precision engineering.

1. Optical system: CCIC infinite chromatic aberration correction optical system
2. Magnification factor: 50X-1000X
3. Observation tube: tilted at 30 °, adjustable range of binocular pupillary distance: 53-75mm
4. Eyepiece: SWF10X eyepiece with a large field of view and no color difference, with a field of view of Ø 22mm
5. Converter: Internal positioning five hole bright dark field converter with DIC slot
6. Objective lens (bright and dark field long working distance flat field achromatic DIC objective) LMPlan5X NA.0.12 LMPlan10X NA.0.3 LMPlan20X NA.0.4 LMPlan5X 50X LMPlan5X 100X
7. Stage: Mechanical, size: 280mmX270mm, movement range: horizontal (X) 204mm, vertical (Y) 204mm
8. Polarization device: polarizer, rotatable 360 degrees, switchable push-pull, polarizer detection, switchable push-pull
9. Lighting system: Falling beam lighting: 12V50W halogen lamp, adjustable brightness; Transmitting lighting: high-power LED
10. DIC Observation System: Suitable for LMPlan5X/LMPlan10X/LMPlan20X DIC Objectives