HAST High Voltage Accelerated Life Test Chamber

HAST High Voltage Accelerated Life Test Chamber*The main purpose is to test the moisture resistance of semiconductor packaging. The tested product is subjected to harsh temperature, humidity, and pressure conditions, and moisture can seep into the packaging along the interface between the gel or gel and the wire frame. Common fault modes include open circuits caused by corrosion in the active metallization area, or short circuits caused by contamination between the pins of the packaging. PCTZ is mainly used to test the moisture resistance of semiconductor packaging. The tested product is subjected to strict temperature, humidity, and pressure testing, and moisture will seep into the packaging body along the interface between the gel or gel and the lead frame.

Vacuum pump design (air extraction inside the boiler) improves pressure stability and reproducibility;

◆ Ultra long running time for experiments, with the experimental machine running for 300 hours for extended periods of time;

◆ Drying design, the termination of the experiment adopts vacuum drying design to ensure the drying of the testing area (test sample);

Water level protection, detected by the water level sensor inside the furnace for protection;

◆ Pressure resistant design, the box body can withstand pressure (140 ℃) of 2.65kg, meeting the water pressure test of 6k;

◆ Two stage pressure safety protection device, using a combination of two-stage controller and mechanical pressure protection device;

◆ Safety protection pressure relief button, emergency safety device two-stage automatic pressure relief button;

HAST High Voltage Accelerated Life Test Chamber*