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Hunan Zhenhua Analytical Instrument Co., Ltd
HCX09A Thin Film Thermal Property Tester
NegotiableUpdate on 05/05
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Overview
HCX09A Thin Film Thermal Property Tester This instrument is used to test the thermal property parameters of thin film materials
Product Details
HCX09A Thin Film Thermal Property Tester
This instrument is used to test the thermal properties of thin film materials. Thin film physics states that when an object is very thin, the physical properties of the same material in a thin film state may not necessarily be the same as those in a volumetric state. Therefore, the measurement of the physical properties of a thin film must be carried out in the thin film state. A transient experimental model based on the cosine (or sine) law of surface temperature variation of an object. This instrument uses the temperature wave method to test the thermal properties of thin film materials, as the thin film is a finite thickness one-dimensional model. In this state, when the temperature oscillation frequency reaches a certain value, the phase difference between the upper and lower surface temperatures of the sample is used to calculate the thermal conductivity or thermal conductivity. Instruments specifically designed for research purposesThermal properties of thin film materials.
Main technical parameters:
1. Thermal conductivity range: 0.05-20w/m · k
2. The instrument realizes digital temperature measurement with an accuracy better than 0.2 level.
3. Measurement results with an accuracy of ± 3%
4. The metering heating power can be adjusted by ± 1%.
5. Sample size requirement: Circular or square piece 100 * 100 * (0.1-5) mm
6. Test temperature: room temperature.
7. Connect to a computer to achieve fully automated testing and analysis.
Instrument configuration: One testing host,
A set of testing software,
A set of computers should be provided by the user themselves,
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