The JAY-3133 low-temperature impact test device from Jiayi Zhuhai has an adjustable impact height and is suitable for conducting low-temperature impact tests on plugs, sockets, switches, etc

NegotiableUpdate on 03/27

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Nature of the Manufacturer: Producers

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Overview

Low temperature impact test device JAY-3133 1. Product overview complies with the requirements of Article 24.4 and 30.4 of GB2099.1-2008 (Figure 27 and Figure 42), IEC60884-1, VDE0620 and other standards; Single group type is suitable for conducting low-temperature impact tests on plugs, sockets, switches, etc

Product Details

Low temperature impact test device

JAY- 3133

1product overview

Comply with the requirements of Article 24.4 and 30.4 of GB2099.1-2008 (Figure 27 and Figure 42), IEC60884-1, VDE0620 and other standards; Single group type is suitable for conducting low-temperature impact tests on plugs, sockets, switches, etc.

IITechnical Parameter

1This low-temperature impact equipment should be used in conjunction with a low-temperature chamber and placed on a sponge rubber pad approximately 40mm thick，Before and during the experiment, it should be placed in a suitable low-temperature chamber

2Drop impact height: adjustable from 10 to 250mm

3Comparison Table of Low Temperature Impact Test Sample Types, Drop Weight, and Drop Height

Low temperature impact test specimen	Standard specifications	Falling hammer mass g	Drop impact height mm	notes
Socket box and similar electrical enclosures	Article 24.4 of GB2099.1-2008, Figure 27	1000±2	100	standard configuration
Pin with insulation sheath	GB2099.1-2008 Clause 30.4, Figure 42	100±1	100	standard configuration