Ultrafast electron microscope

Hundred fold ultra fast multi beam automatic electron microscope, the next generation electron microscopy imaging system

The FAST-EM launched by Delmic is an ultra fast automatic multi beam electron microscope designed to make complex and large-scale microscopic observation projects simple and efficient.FAST-EM has automatic data acquisition capabilities, making this high-throughput system ideal for imaging large or multiple samples for quantitative analysis.The system provides powerful microscopy imaging capabilities while greatly simplifying workflows, allowing users to shift their focus from microscopy operations to truly high-value data analysis.

FAST-EM,It is necessary for large-scale 3D structure analysis and batch 2D imaging,Can be used to explore:

• Cellular structure
• Neural circuit network
• Analysis of various biomaterials in life sciences
• As a universal tool, it can significantly accelerate the speed of other routine electron microscopy imaging tasks in daily life

Faster imaging

64 parallel electron beams with ultra short dwell time achieve ultra fast data acquisition speed

Focus on data analysis

No need for user supervision, the system automatically collects data, allowing users to focus on data analysis itself

Realize sustained high throughput

Balancing ultra fine details and large field of view

Obtain nanoscale ultrastructure and obtain large-scale imaging of the sample.