ES622 Series TLP Pulse IV Curve System

NegotiableUpdate on 01/02

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

The ES622 series TLP pulse IV curve system is an advanced IV curve characterization system designed to simulate the high-power time-domain characteristics of ESD events (TLP/VF-TLP/HMM/HMM pulses) and monitoring devices (semiconductors, discrete devices, circuit modules, etc.). Compared to the previous generation ES620 and ES621 models, the ES622 TLP system has higher specifications, more functions, stronger expansion capabilities, and a better software experience.

Product Details

ESDMEC Technology LLC was founded by Wei Huang in March 2011 in Rolla, Missouri, USA.ESDMEC develops ESD and EMC solutions. The company is committed to providing innovative, advanced, high-quality, and cost-effective solutions, as well as general consulting, testing services, and customized projects.The product includes charging equipment model (CDM) system, cableDischarge Event (CDE) system, ESD simulator, pulse attenuator, current probe, TEM battery for RF transmission/immunity, high-voltage DC power supply, customized high-voltage/RF design.ESDMEC Technology has been a corporate member of the ESD Association since 2012.

ES622 Series TLP Pulse IV Curve SystemIt is an advanced IV curve characterization system designed to simulate the high-power time-domain characteristics of ESD events (TLP/VF-TLP/HMM/HBM/MM pulses) and monitoring devices (semiconductors, discrete devices, circuit modules, etc.). Compared to the previous generation ES620 and ES621 models, the ES622 TLP system has higher specifications, more functions, stronger expansion capabilities, and a better software experience.

The transmission line pulse (TLP) testing function is designed to meet the latest ANSI/ESD STM5.5.1 testing standard, injecting high-quality rectangular pulses into the tested device and recording the voltage and current passing through the device at both ends. The testing software can automatically draw pulse IV curves and characterize the transient response of the device within a nanosecond time window. The equipment integrates advanced automatic component fault detection methods, such as DC single point detection (V or I), static IV curve, melting, breakdown, and bias source fluctuation.

The VF-TLP test aims to simulate CDM type ESD events and capture the voltage across the DUT and the current passing through the DUT under high-speed (e.g.<100 ps rise time) ESD injection. This test can be used to study the response speed and peak clamping voltage characteristics of the device.

The human body metal model (HMM) testing function is an alternative testing method for IEC61000-4-2 system level ESD. It provides ideal equivalent waveforms for low resistance devices and eliminates many IEC gun testing issues at the component or wafer level, such as poor repeatability, inaccurate gun tip injection position, impedance mismatch, EMI interference from unshielded relays, and special device requirements that require large ground planes and coupling planes.

Product Features

■Flexible configurable TLP pulse IV curve system

■Ultra compact design

■Ultra fast testing speed with multi-threaded processing capability

■provide20 AThe40AThe50 AThe100 AThe125AThe150 AModel (customizable)

■Advanced testing software, programmable, monitoring system testing equipment and accessories (switch life detection, E-CAL module, oscilloscope)Device attenuation adjustment prompt, etc

■Can expand multiple testing functions:VF-TLPTheHMMTheHBMTheMM

■Multiple automatic fault detection methodsDC single point detection（VorI）OrIVScanning, melting, breakdown, and bias current changes

■Software controlled pulses: single pulse, continuous pulseIVCurve scanning test

■Range of selectable rise time:40 psto1200 ns(Depending on the model, customizable)

■Pulse width optional range:0.5 nsto2000 ns(Depending on the model, customizable)

Product Application

■ESD performance characterization

■Wafer/Package Level ESD Testing

■ESD testing of system/circuit modules

■Safe Operating Area (SOA) Testing

■Charging recovery time test

■Characteristics of solar panel diodes

■Touch screen ITO microstrip line melting and breakdown test

Related standards:

■TLP/VF-TLP options comply with ANSI/ESD STM 5.5.1 standard, HMM options comply with ANSI/ESD SP5.6 standard

■The HBM option complies with the ANSI/ESDA/JEDEC JS-001 standard

■MM option complies with ANSI/ESDA SP5.2 standard

ES622 Series TLP Pulse IV Curve SystemProduct Specifications

ES622 Series TLP Unit Specification Table
typical model	ESS622-20	ESS622-50	ESS622-100	ESS622-125	ESS622-150	unit	*Special models can be provided upon request, such as 40/60/80/100/200+A
Open circuit output voltage	± 0.5 ~1000	± 0.5 ~2500	± 0.5 ~5000	± 0.5 ~6250	± 0.5 ~7500	V
Minimum voltage step size	0.1	0.1	0.1	0.1	0.1	V
Short circuit output current	± 0.01 ~20	± 0.01 ~50	± 0.01 ~100	± 0.01 ~125	± 0.01 ~150	A
voltage accuracy	Accuracy can be adjusted between 1-10%					%	Speed/accuracy software adjustable
Fastest rise time * (default 20-80%)	≤50	≤200	≤300	≤300	≤300	ps	Can provide up to 40ps (10-90%) rise time at the fastest
Rising time range	0.04~1200	0.2~1200	0.3~1200	0.3~1200	0.3~1200	ns
Rise time option	Unlimited programmable or manual options						customizable
Default pulse width	100±1					ns	50-50%
minimum pulse width	0.5	1	5	5	5	ns
Maximum pulse width	2000	2000	1500	1500	1000	ns
Pulse Width Options	Unlimited programmable or manual options						customizable
test speed	Usually 0.2~2					Sec	Due to differences in hardware settings
size	347 W X 300 D X 145 H					mm	May change due to customization
weight	8	8	8	10	12	kg
Supported oscilloscopes	The main series of Tektronix, Agilent, LeCroy, Rigol						Other support available upon request
Supported SMUs	Keithley 24xx/26xx series SMU						Other support available upon request

Shanghai Zhengheng ElectricShzhtech Technology Co., LtdWe are a diversified company that integrates the agency sales of instruments and meters, the provision of testing solutions, pre-sales and after-sales technical support, and the maintenance of instruments and meters. Committed to providing professional and complete testing solutions, technical training, and maintenance services for customers in related fields.