ES650 Automated Probe System

ESDMEC Technology LLC was founded by Wei Huang in March 2011 in Rolla, Missouri, USA.ESDMEC develops ESD and EMC solutions. The company is committed to providing innovative, advanced, high-quality, and cost-effective solutions, as well as general consulting, testing services, and customized projects.The product includes charging equipment model (CDM) system, cableDischarge Event (CDE) system, ESD simulator, pulse attenuator, current probe, TEM battery for RF transmission/immunity, high-voltage DC power supply, customized high-voltage/RF design.ESDMEC Technology has been a corporate member of the ESD Association since 2012.

ES650 Automated Probe SystemIt is a 2-pin detection solution suitable for automated probe stations for HBM, MM, TLP, HMM, CC-TLP, LI-CCDM, RP-CDM, and CDM (JS-002) measurements on package level, wafer level, and circuit board level devices.In addition to ESD testing solutions, the ES650 can also be used independently for its automated detection function, enabling precise automation of probe applications such as RF measurement, I-V curve tracking, and many other applications that require precise detection. The detection system uses two independently controlled (left and right) XYZ racks with probes for contacting pins or pads on chips or wafers. ES650 does not require a socket PCB and has fewer parasitic effects compared to relay based solutions. In addition, the system also supports multi device testing, which can achieve fault detection and stopping criteria for automatic classification of multiple devices during testing.

Probe testing is a very time-consuming part of device testing, especially for high pin count devices using HBM, where most pins need to be tested through all possible 2-pin combinations. A fully automated testing system can greatly improve testing efficiency, reduce time and measurement errors.

In addition to the HBM pulse module, the ES650 also provides modules for other pulse testing, such as MM and HMM, as well as CDM type solutions such as FICDM, LI-CCDM, CC-TLP, and RP-CDCM (a CDM method based on contact type first relays that is currently being applied for). The system can also provide mechanical measurements for other testing methods such as TLP, EOS, and RF detection.

Product Features

● Pin alignment can be easily achieved through high-resolution cameras on each probe arm

High precision operation control system (minimum accuracy of 1 micron)

Batch device testing

● Leakage detection

● Automatic collision avoidance

During testing, the probe contact can be observed through a camera

● Customizable test sizes suitable for all types of device testing requirements

The current probe adopts a near DUT design

● Equipment supporting program

HBM testing module

● Data analysis

Product Application

● Fully automatic 2-pin detection system

S tests various popular ESD standards and methods, with leakage testing function:

√ ANSI/ESDA/JEDECJS-001-2017 (HBM)

√ ANSI/ESDASTM5.2-2019(MM)

√ ANSI/ESDASP5.6-2009(HMM)

√ ANSI/ESDASTM5.5.1-2016(TLP)

√ ANSI/ESDA/JEDECJS-002-2018(FICDM)

√ CC-TLP(ESDA SP to be determined, VF-TLP required)

√ ANSI/ESDSP5.3.3-2018(LI-CCDM, VF-TLP required)

√ RP-CDM testing (under application)

√ Can be customized according to needs

ES650 Automated Probe SystemProduct Specifications

Shanghai Zhengheng Electronic Technology Co., Ltd. shzhtechWe are a diversified company that integrates the agency sales of instruments and meters, the provision of testing solutions, pre-sales and after-sales technical support, and the maintenance of instruments and meters. Committed to providing professional and complete testing solutions, technical training, and maintenance services for customers in related fields.