HAST high temperature and high pressure aging test chamber

The HAST high temperature and high pressure aging test chamber is a device used for accelerated aging testing, mainly used to simulate high temperature, high humidity, and high voltage environments to evaluate the reliability and durability of electronic components, semiconductors, microelectronic chips, and other products.

Suitable for accelerated life testing of products related to national defense, aerospace, automotive components, electronic parts, plastics, pharmaceuticals, and other industries. Used in the design phase of products to quickly expose defects and weak links.

Widely used in circuit boards, multi-layer circuit boards, IC semiconductors, LCD, Testing the sealing performance of magnets and other products, testing their pressure resistance and airtightness.

Product features:

• Adopting a dual circuit structure of imported high-temperature resistant solenoid valves, the failure rate is minimized to the greatest extent possible.

• Independent steam generation chamber to avoid direct impact of steam on the product and prevent local damage to the product.

• The labor-saving structure of the door lock solves the problem of difficult locking of the first generation product's disc handle.

• Test front cold air; The design of discharging cold air during the experiment (discharging air from the test bucket) improves pressure stability and reproducibility

• Ultra long experimental operation time, with the experimental machine running for more than 1000 hours for a long time

• Water level protection, detected by the water level sensor in the laboratory

• Tank pressure resistant design, the box body can withstand pressure (150 ℃) of 2.65kg, which meets the water pressure test of 4kg

• The two-stage pressure safety protection device adopts a combination of two-stage controller and mechanical pressure protection device

• Safety protection pressure relief button, emergency safety device two-stage automatic pressure relief button

• The voltage withstand of the bias test terminal can reach 3000V (optional)

• Export historical data and curves via USB

Basic parameters:

Applicable standards:

GB/T2423.40-1997 Environmental testing for electrical and electronic products Part 2: Test methods Cx: Constant humidity and heat of unsaturated high-pressure steam

IEC60068-2-66-1994 Environmental Testing Part 2-66: Test Methods Test Cx: Steady state Damp Heat

Temperature and humidity offset lifetime of JESD22-A100 cycle

JESD22-A101 steady-state temperature, humidity/bias voltage, life test (temperature humidity bias voltage life)

JESD22-A102 High Pressure Steaming Test (Accelerated Moisture Resistance Penetration)

JESD22-A108 Temperature, Bias Voltage, and Operating Life

JESD22-A110 HAST High Acceleration Temperature and Humidity Stress Test

JESD22-A118 High Acceleration Stress Experiment without Bias Voltage UHAST (Unsaturated High Voltage Steam without Bias Voltage)

WEISSTECH website:

http://www.weiss.tech/

http://www.weiss.cx/

http://www.weiss17.com

http://www.qe-test.com

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