RTP-80CT High and Low Temperature Test Chamber

The RTP-80CT high and low temperature test chamber is mainly used in industries and fields such as electronics and electrical engineering, automotive and motorcycle, aerospace, universities, research institutions, etc. The difference between it and the constant temperature and humidity chamber is that it cannot perform humidity related tests.

The RTP-80CT high and low temperature test chamber meets the test standards

① GB/T 2423.1-2001 Test A: Low temperature test method

② GB/T 2423.2-2001 Test B: High temperature test method

③ GJB 150.3-1986 High Temperature Test

④ GJB 150.4-1986 Low Temperature Test

⑤ IEC68-2-1 Test A: Cold

⑥ GB 11158 Technical Conditions for High Temperature Test Chambers

⑦ GB/T 2423.2 Basic Environmental Testing Procedures for Electrical and Electronic Products - Test B: High Temperature Test Method

RTP-80CT High and Low Temperature Test Chamber Program Capacity and Control Function

Available program groups: up to 120 PATTEN.

Available memory capacity: 12000 SEGMENT in total.

Repeatable command execution: Each command can be executed up to 999 times.

The production of the program adopts a conversational style, with functions such as editing, clearing, and inserting.

SEGMENT time is set from 0 to 999Hour59Min.

Equipped with power-off program memory, it automatically starts and continues to execute program functions after power restoration.

Equipped with RS-232 communication and USB interface.

ChengReal time display of graphical curves during sequential execution.

It has the function of scheduled startup and shutdown.

Button and screen lock (LOCK) function.

Technical parameters of RTP-80CT high and low temperature test chamber: