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Beijing Yakechenxu Technology Co., Ltd
EVG 50 detection system
NegotiableUpdate on 03/19
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Overview
EVG 50 is a high-speed and high-precision thickness measurement tool, commonly used for measuring the thickness of each layer on multi-layer or single-layer wafers.
Product Details
Product Introduction:
EVG 50 is a high-speed and high-precision thickness measurement tool, commonly used for measuring the thickness of each layer on multi-layer or single-layer wafers.
Main features and parameters:
·Multi layer thickness measurement
·Measurement of intermediate layer thickness
·Key interface inspection
·Can be used as a standalone device or integrated into EVG's large-scale process platform
