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Beijing Yakechenxu Technology Co., Ltd
Bruker AFM Dimension FastScan
NegotiableUpdate on 03/19
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Overview
Bruker AFM Dimension FastScan
Product Details
Dimension ® FastScan ™ It is a technological innovation based on the world's most widely used atomic force microscope platform by Brooke Company. The combination of a fast scanning system and an ultra stable, low-noise platform enables this system to surpass any single device purchased in your laboratory, achieving true value for money, whether it is ultra-low noise, high-precision scanning, or high-speed scanning. To meet the needs of atomic force microscope users for improving efficiency, this fast scanning system helps users achieve their desire to obtain high-resolution and high-quality images in real time without reducing resolution, increasing equipment complexity, or affecting instrument operating costs. FastScan ™ This transformative technology redefines the new heights of atomic force microscopy.
【 Main Applications 】
1. Mainly used for measuring the nanoscale surface morphology and roughness of materials, as well as testing the surface mechanical properties, electrical, magnetic, and electrochemical physical characteristics of nanomaterials;
2. Widely used in semiconductor, nanomaterials, communication, biology, data storage, food, chemistry, geology, energy, environment and other fields.
【 Main Parameters 】
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|
Icon AFM scanning tube |
FastScan AFM scanning tube |
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XY direction scanning range |
90μmx90μm（typical value），85μm（Minimum value |
35 μ m x 35 μ m (typical value), minimum value of 30 μ m |
|
Z-direction scanning range |
10 μ m (typical value), 9.5 μ m (minimum value) |
≥ 3μm |
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Vertical noise level |
<30pm RMS value (typical imaging bandwidth can reach up to 625Hz in suitable environments) |
<40pm RMS value (typical imaging bandwidth can reach up to 625Hz in suitable environments) |
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X-Y maximum needle tip speed (1% trajectory error) |
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>2mm/S |
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Z maximum needle tip speed |
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12mm/S |
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XY direction closed-loop noise level |
≤ 0.15nm RMS value (typical imaging bandwidth conditions can reach up to 625Hz) |
≤ 0.20nm RMS (typical imaging bandwidth conditions can reach up to 2.5KHz) |
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Z-direction closed-loop noise level |
35pm RMS value (under suitable conditions, the typical imaging bandwidth can reach up to 625Hz); 50pm RMS value, force curve bandwidth (0.1Hz to 5kHz) |
30pm RMS (under suitable conditions, the typical imaging bandwidth can reach up to 625Hz) |
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Flatness in XY direction (30 μ m range) |
|
≤ 3nm |
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Nonlinear parameters in the XYZ direction |
<0.5% |
<0.5% |
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Sample size and fixing method |
210mm diameter, vacuum adsorption, ≤ 15mm thickness |
210mm diameter, vacuum adsorption, ≤ 15mm thickness |
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Motor driven sample stage (X-Y axis) |
180mm × 150mm observable area; Unidirectional 2 μ m repeatability; Bidirectional 3 μ m repeatability |
180mm × 150mm observable area; Unidirectional 2 μ m repeatability; Bidirectional 3 μ m repeatability |
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optical system |
5-megapixel digital camera; 180 μ m to 1465 μ m visible area; Digital scaling, motor-driven focusing |
5-megapixel digital camera; 130 μ m to 1040 μ m visible area; Digital scaling, motor-driven focusing |
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controller |
NanoScope V |
NanoScope V |
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Vibration isolation |
Optional shockproof platform or soundproof shockproof platform, pneumatic type |
Optional shockproof platform or soundproof shockproof platform, pneumatic type |
