Microscopic spectrophotometer (OPTM series)

Microscopic spectrophotometer (OPTM series)

Measure the reflectivity of the target film, accurately measure the film thickness and optical constants! Non contact, Non destructive, Microscopic

The measurement time is only 1 second!

The OPTM series uses microscopic spectroscopy to measure reflectance in small areas, allowing for high-precision analysis of film thickness/optical constants. Measure the thickness of coatings through non-destructive and non-contact methods, such as various films, chips, optical materials, and multilayer films. In terms of measurement time, it can achieve high-speed measurement of 1 second per point, and is equipped with software that can easily analyze optical constants even for first-time users

Product Features:

The head integrates the necessary functions for measuring film thickness

Measurement of high-precision reflectance (multilayer film thickness, optical constants) using microspectroscopy

1:1 high-speed measurement

Optical system with wide range under microscopic spectroscopy (UV * * * near-infrared)

Security mechanism of regional sensors

Easy to analyze guide, beginners can also perform optical constant analysis

Independent measuring heads correspond to various inline customization requirements

Support various customizations

Measurement items:

**Reflectance measurement

Analysis of multilayer films

Optical constant analysis (n: refractive index, k: extinction coefficient)

Application:

Semiconductor: automatic adjustment of wafer samples, wafer bending detection

Optical components: detection of emissivity, bending, and other parameters of lens lenses

Microscopic spectrophotometer (OPTM series)Product specifications and models: