Rapid low vacuum pumping scanning electron microscope

Zhongtu Instrument CEM3000 SeriesRapid low vacuum pumping scanning electron microscopeIt is a compact device used for microscale morphology observation and analysis of samples. Provide B-end customers with "space saving, time saving, and cost saving" detection solutions. Whether it's research and development upgrades, batch quality inspections, or on-site testing, we can accurately match your needs.

The CEM3000 series desktop scanning electron microscope has been thoroughly optimized, with excellent size utilization in terms of structure, ensuring that its outstanding performance is no longer limited by environmental dimensions. Whether it is a daily work desk or a small space, the CEM3000 series desktop scanning electron microscope can always accompany users wherever they need it.

1、 Product Features

1. Freedom of Space

(1) Desktop level compact design, no need for dedicated laboratory, daily workbench can be placed, and nearby testing does not require running around.

(2) Support flexible relocation, with one device covering multiple scenarios such as laboratories, production lines, glove boxes, and train carriages, making batch testing or cross station use more efficient.

(3) With the support of anti vibration and anti magnetic hard core technology, conventional electron microscopes can still stably output data in complex environments that are difficult to tolerate, such as workshop vibrations and magnetic field interference, without the need for additional environmental modifications.

2. Efficient and worry free

(1) Quick exhaust design+low vacuum mode (optional), low vacuum state only takes 40 seconds to exhaust (CEM3000B model), significantly reducing waiting time and improving detection throughput.

(2) One click film output+automatic adjustment function, no need for a professional operation and maintenance team, ordinary employees can quickly get started, reduce labor training costs, and efficiently obtain high-quality imaging.

(3) Tungsten filament electron guns have strong stability and low vacuum requirements, reducing equipment maintenance frequency and costs, and continuously ensuring production/research and development continuity.

3. Accurate adaptation

(1) High resolution imaging+multiple imaging parameters to choose from, with clear presentation of microscale features (such as 60nm silver lines), meeting professional level needs such as material analysis and defect detection.

(2) Large sample warehouse design (CEM3000A model 70mm × 70mm), comparable to the capacity of vertical electron microscopes, easily accommodates large-sized samples or batch samples, suitable for batch quality inspection scenarios.

(3) Standard secondary electronic probe+multi quadrant backscatter probe, optional energy spectrometer, realizing dual functions of microstructure and element analysis, one-stop solution for multi type sample detection needs.

2、 Application industry

1. Materials Science: Microstructure analysis of nanomaterials, high entropy alloy powders, zinc oxide, and other materials to assist in research and development breakthroughs.

2. New energy: defect detection and coating performance evaluation of solar panels to ensure product reliability and power generation efficiency.

3. Biomedical: Surface morphology observation of microfluidic chips, research on drug carriers, accelerating the development of medical devices and drugs.

4. Industrial quality inspection: Inspection of solder ball welding quality and surface roughness of precision components to improve product qualification rate and quality control accuracy.

5. Expand fields: life sciences, nanotechnology, and other multiple scenarios to meet the testing needs of more segmented industries.

3、 Model specifications

Note: Product parameters may be updated in real-time based on technological upgrades, and the latest configuration shall prevail. For details, please consult customer service for complete information.

Restricted testing site, complex operations that slow down progress, and inaccurate data in vibration environments? Are these pain points hindering your efficiency upgrade in B-end scenarios such as material research and development, industrial quality inspection, and new energy testing? Zhongtu Instrument CEM3000 SeriesRapid low vacuum pumping scanning electron microscope4nm HD+40 second fast detection! With the four core advantages of "spatial freedom+efficiency and precision+customized adaptation+reliable guarantee", we aim to meet the core requirements of B-end detection, making micro observation more flexible, efficient, and reliable.

Click to consult for free customized model selection report+free sample testing qualification+technical solution demonstration, empowering your business growth with efficient testing!