Raman Atomic Force Microscopy Combined System

NegotiableUpdate on 03/16

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Nature of the Manufacturer: Producers

Product Category

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Overview

Confocal Raman Spectrometer: Main features: 1. Sensitivity far higher than other similar Raman spectrometers, modular design, wavelength can be freely selected, flexible configuration, easy upgrade

Product Details

Confocal Raman Microscopy Spectrometer:
Main features:
1. The sensitivity is much higher than other similar Raman spectrometers, modular design, wavelength can be freely selected, flexible configuration, and easy upgrade.
2. All transmission components are controlled by a grating ruler closed-loop system, which improves the accuracy and repeatability of the instrument by an order of magnitude compared to other similar spectrometers.
3. It can continuously scan a wide range of Raman spectra at once (patent), without the need for spectroscopy or the use of low resolution gratings.
4. The latest patented confocal microscopy system can continuously adjust the confocal depth and greatly improve the instrument's luminous flux and stability.
5. Patent protected Raman or fluorescence signals can be directly imaged in one go to quickly obtain the spatial distribution of materials.

Atomic force microscope:
Main features:
Bruker Dimension ® Icon ™ Atomic force microscopy has brought a new AFM application experience to researchers in the nanoscale fields of industry and research, with powerful testing capabilities and easy operation. Based on the world's most widely used AFM large sample platform, we have gathered decades of technical experience from Dimension systems, received feedback from our customers, and combined it with equipment requirements in the industrial field for comprehensive innovation. The brand new system design has achieved unprecedented low drift and low noise levels, and now users can obtain real and accurate scanned images in just a few minutes.

Dimension ® Icon ™ Excellent image resolution, combined with Bruker's unique electronic scanning algorithm, significantly improves measurement speed and quality. Dimension ® The series of large sample stage atomic force microscopes have always been in a leading position in the industry, with the latest Dimension ® Icon ™ This is another innovation in needle tip scanning technology, equipped with temperature compensated position sensors, achieving low noise levels of sub angstroms in the Z-axis and angstroms in the XY axis. When applied to a large sample stage system with a scanning range of 90 microns, the effect is even better than the open-loop noise level of high-resolution small sample stage AFM. The newly designed XYZ closed-loop scanning head will not damage image quality even when working at high scanning speeds, achieving greater data acquisition and output.

Raman Atomic Force Microscopy Combined System:
You can combine inVia Raman capability with scanning probe microscopy (SPM and AFM) to study the composition, structure, and properties of materials at the nanoscale.

Advantages of the integrated system:
In situ measurement. No need to move samples between different instruments, saving time and ensuring the correct analysis area.
InVia and SPM/AFM can be used as independent systems simultaneously without affecting any performance of both.
Obtain rich sample information. Use AFM to record the morphology and related physical properties of the sample. Enhance the ability to analyze chemical information of samples using Raman spectroscopy to identify materials and non-metallic compounds.
Can achieve tip enhanced Raman spectroscopy (TERS) to obtain chemical information at the nanoscale.

Choose the best system:
Renishaw's specially designed flexible coupling arm can be used to integrate inVia with SPM or AFM optics. InVia has great flexibility and can be directly coupled to various AFM and SPM from the following suppliers:

· Bruker Nano Surfaces

· Nanonics
· NT-MDT
· JPK
· Par